• DocumentCode
    2785973
  • Title

    Pentacene based organic thin-film transistor as gas sensor

  • Author

    Liu, Bo ; Xie, Guang-Zhong ; Du, Xiao-song ; Li, Xian ; Sun, Ping

  • Author_Institution
    State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China (UESTC), Chengdu, China
  • fYear
    2009
  • fDate
    23-25 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A bottom contact pentacene based organic thin film transistor (OTFT) was fabricated in this paper. Pentacene thin film acting both as gas sensing layer and the active layer was formed by vacuum evaporation and was characterized by atomic force microscopy (AFM) and x-ray diffraction (XRD). The results show that the film is highly ordered and has a polycrystalline morphology. The current-voltage characteristics of the OTFT was also investigated. The drain-source current in the saturation region would changed when the OTFT was exposed to alcohol vapor compared to that under an exposure to nitrogen gas. It indicates that the drain-source current can be considered as a key parameter to monitoring chemical species. Such OTFTs devices are promising to act as a novel class of chemical sensors.
  • Keywords
    X-ray diffraction; atomic force microscopy; gas sensors; organic compounds; surface morphology; thin film transistors; vacuum deposition; X-ray diffraction; active layer; alcohol vapor; atomic force microscopy; current-voltage characteristics; drain-source current; gas sensing layer; gas sensor; nitrogen gas; pentacene based organic thin-film transistor; polycrystalline morphology; saturation region; vacuum evaporation; Atomic force microscopy; Atomic layer deposition; Force sensors; Gas detectors; Morphology; Organic thin film transistors; Pentacene; Thin film transistors; X-ray diffraction; X-ray scattering; alcohol vapor; gas sensor; organic thin film transistor; pentacene;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Apperceiving Computing and Intelligence Analysis, 2009. ICACIA 2009. International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-5204-0
  • Electronic_ISBN
    978-1-4244-5206-4
  • Type

    conf

  • DOI
    10.1109/ICACIA.2009.5361165
  • Filename
    5361165