Title :
Development of window CE driver of high speed ADC based on SPI
Author :
Dongmei, Du ; Qing, He ; Bin, Tang ; Fei, Chen
Author_Institution :
Key Lab. of Condition Monitoring & Control for Power Plant Equip., North China Electr. Power Univ., Beijing, China
Abstract :
A connection between the S3C2440, an ARM9-based 32-bit embedded MCU made by Samsung, and the ADS1274, a analog-to-digital converter with 24-bit, delta-sigma, data rates up to 128 k samples per second, allowing simultaneous sampling of four channels made by Texas Instruments, is presented. The driver based on the Windows CE5.0 that is an embedded operating system has been developed. Using fast interruption (FIQ), the problem of high-speed transmission mass data between high-speed A/D converting and SPI serial interface has been solved. It is proved that the sampling frequency is up to the maximum of system and the sampled signal is accurate and reliable.
Keywords :
analogue-digital conversion; device drivers; microcontrollers; operating systems (computers); Texas Instruments; Window CE driver; Windows CE5.0; analog-to-digital converter; embedded operating system; high speed ADC; high-speed transmission mass data; microcontrol unit; sampling frequency; serial interface; Computer science; Computer science education; Condition monitoring; Control engineering education; Helium; Laboratories; Power engineering and energy; Power engineering education; Power generation; Sampling methods; Data Acquisition; Driver Program; Embedded Systems; SPI; Windows CE;
Conference_Titel :
Control and Decision Conference, 2009. CCDC '09. Chinese
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-2722-2
Electronic_ISBN :
978-1-4244-2723-9
DOI :
10.1109/CCDC.2009.5192081
