Title :
Fiber-free characterization of photonic integrated circuits by thermoreflectance microscopy
Author :
Farzaneh, M. ; Hudgings, Janice A. ; Ram, Rajeev J.
Author_Institution :
Department of Physics, Mount Holyoke College, South Hadley, MA 0I075, USA
Abstract :
We demonstrate the use of amplified spontaneous emission in thermoreflectance imaging of photonic integrated circuits for fiber-free characterization of the integrated cascaded semiconductor optical amplifiers.
Keywords :
Integrated optics; Optical fiber devices; Optical fiber testing; Optical microscopy; Optical surface waves; Photonic integrated circuits; Semiconductor optical amplifiers; Stimulated emission; Temperature; Thermoreflectance;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/QELS.2007.4431270
