DocumentCode
2786541
Title
Fiber-free characterization of photonic integrated circuits by thermoreflectance microscopy
Author
Farzaneh, M. ; Hudgings, Janice A. ; Ram, Rajeev J.
Author_Institution
Department of Physics, Mount Holyoke College, South Hadley, MA 0I075, USA
fYear
2007
fDate
6-11 May 2007
Firstpage
1
Lastpage
2
Abstract
We demonstrate the use of amplified spontaneous emission in thermoreflectance imaging of photonic integrated circuits for fiber-free characterization of the integrated cascaded semiconductor optical amplifiers.
Keywords
Integrated optics; Optical fiber devices; Optical fiber testing; Optical microscopy; Optical surface waves; Photonic integrated circuits; Semiconductor optical amplifiers; Stimulated emission; Temperature; Thermoreflectance;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location
Baltimore, MD, USA
Print_ISBN
978-1-55752-834-6
Type
conf
DOI
10.1109/QELS.2007.4431270
Filename
4431270
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