• DocumentCode
    2786591
  • Title

    Influence of Impurity Scattering on Spin Injection Efficiency at a Ferromagnet/Semiconductor Quantum Wire Interface

  • Author

    Wan, J. ; Cahay, M. ; Bandyopadhyay, S.

  • Author_Institution
    Department of Electrical and Computer Engineering and Computer Science, University of Cincinnati, Cincinnati, OH 45221, USA
  • Volume
    2
  • fYear
    2006
  • fDate
    17-20 June 2006
  • Firstpage
    826
  • Lastpage
    829
  • Abstract
    The influence of impurity scattering on the electrical spin injection efficiency from a non-ideal ferromagnet into a semiconductor quantum wire is investigated. We take into account the presence of an axial magnetic field along the direction of current flow and spin orbit interaction in the wire. If the wire contains a non-magnetic charged impurity, then the zero temperature interface conductance depends strongly on the exact location of this impurity. When calculated as a function of the applied gate bias, the spin injection efficiency is a much more sensitive function of the location and strength of the scattering potential for an attractive scatterer. However, at absolute zero temperature, an injection efficiency close to 100% can be obtained for both types of impurities if carriers are injected with energies that coincide with the Zeeman energy states in the wire. The temperature dependence of maximum spin injection efficiency is calculated for both attractive and repulsive impurity potentials.
  • Keywords
    Impurity scattering; non-magnetic impurity; quantum wire; spin injection efficiency; Detectors; Energy states; Magnetic fields; Particle scattering; Quantum computing; Semiconductor impurities; Spin polarized transport; Temperature dependence; Temperature sensors; Wire; Impurity scattering; non-magnetic impurity; quantum wire; spin injection efficiency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
  • Print_ISBN
    1-4244-0077-5
  • Type

    conf

  • DOI
    10.1109/NANO.2006.247786
  • Filename
    1717236