DocumentCode
2786591
Title
Influence of Impurity Scattering on Spin Injection Efficiency at a Ferromagnet/Semiconductor Quantum Wire Interface
Author
Wan, J. ; Cahay, M. ; Bandyopadhyay, S.
Author_Institution
Department of Electrical and Computer Engineering and Computer Science, University of Cincinnati, Cincinnati, OH 45221, USA
Volume
2
fYear
2006
fDate
17-20 June 2006
Firstpage
826
Lastpage
829
Abstract
The influence of impurity scattering on the electrical spin injection efficiency from a non-ideal ferromagnet into a semiconductor quantum wire is investigated. We take into account the presence of an axial magnetic field along the direction of current flow and spin orbit interaction in the wire. If the wire contains a non-magnetic charged impurity, then the zero temperature interface conductance depends strongly on the exact location of this impurity. When calculated as a function of the applied gate bias, the spin injection efficiency is a much more sensitive function of the location and strength of the scattering potential for an attractive scatterer. However, at absolute zero temperature, an injection efficiency close to 100% can be obtained for both types of impurities if carriers are injected with energies that coincide with the Zeeman energy states in the wire. The temperature dependence of maximum spin injection efficiency is calculated for both attractive and repulsive impurity potentials.
Keywords
Impurity scattering; non-magnetic impurity; quantum wire; spin injection efficiency; Detectors; Energy states; Magnetic fields; Particle scattering; Quantum computing; Semiconductor impurities; Spin polarized transport; Temperature dependence; Temperature sensors; Wire; Impurity scattering; non-magnetic impurity; quantum wire; spin injection efficiency;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2006. IEEE-NANO 2006. Sixth IEEE Conference on
Print_ISBN
1-4244-0077-5
Type
conf
DOI
10.1109/NANO.2006.247786
Filename
1717236
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