Title :
A statistical framework for geometric tolerancing manufactured parts
Author :
Ji, Qiang ; Haralick, Robert M.
Author_Institution :
Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
Abstract :
Visual inspection of a part from its image is always affected by image errors. Understanding how image errors affect measurement precision is therefore critical for accurate inspection. In this paper we lay out a statistical framework that allows one to explicitly handle image errors and characterize their impact on measurement precision. A hierarchical model is also proposed to model manufacturing and measurement errors. Based on the model, a Bayesian technique is introduced to statistically infer the geometric tolerances of a manufactured part
Keywords :
Bayes methods; automatic optical inspection; computer vision; curve fitting; error analysis; least squares approximations; manufacturing data processing; measurement errors; statistical analysis; tolerance analysis; Bayes method; circle fitting; error statistics; geometric tolerancing; image errors; least squares line fitting; manufactured parts; measurement errors; statistical analysis; visual inspection; Bayesian methods; Electrical capacitance tomography; Inspection; Integrated circuit noise; Intelligent manufacturing systems; Laboratories; Measurement errors; Measurement uncertainty; Noise measurement; Position measurement;
Conference_Titel :
Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
Conference_Location :
Brisbane, Qld.
Print_ISBN :
0-8186-8512-3
DOI :
10.1109/ICPR.1998.712058