• DocumentCode
    2786835
  • Title

    A statistical framework for geometric tolerancing manufactured parts

  • Author

    Ji, Qiang ; Haralick, Robert M.

  • Author_Institution
    Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA
  • Volume
    2
  • fYear
    1998
  • fDate
    16-20 Aug 1998
  • Firstpage
    1728
  • Abstract
    Visual inspection of a part from its image is always affected by image errors. Understanding how image errors affect measurement precision is therefore critical for accurate inspection. In this paper we lay out a statistical framework that allows one to explicitly handle image errors and characterize their impact on measurement precision. A hierarchical model is also proposed to model manufacturing and measurement errors. Based on the model, a Bayesian technique is introduced to statistically infer the geometric tolerances of a manufactured part
  • Keywords
    Bayes methods; automatic optical inspection; computer vision; curve fitting; error analysis; least squares approximations; manufacturing data processing; measurement errors; statistical analysis; tolerance analysis; Bayes method; circle fitting; error statistics; geometric tolerancing; image errors; least squares line fitting; manufactured parts; measurement errors; statistical analysis; visual inspection; Bayesian methods; Electrical capacitance tomography; Inspection; Integrated circuit noise; Intelligent manufacturing systems; Laboratories; Measurement errors; Measurement uncertainty; Noise measurement; Position measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 1998. Proceedings. Fourteenth International Conference on
  • Conference_Location
    Brisbane, Qld.
  • ISSN
    1051-4651
  • Print_ISBN
    0-8186-8512-3
  • Type

    conf

  • DOI
    10.1109/ICPR.1998.712058
  • Filename
    712058