• DocumentCode
    2787077
  • Title

    Enhancement of IEEE 802.15.4 MAC layer to combat correlated channel errors

  • Author

    Singh, Jasvinder ; Pesch, Dirk

  • Author_Institution
    Nimbus Centre for Embedded Syst. Res., Cork Inst. of Technol., Cork, Ireland
  • fYear
    2011
  • fDate
    20-24 June 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    In indoor environment, the IEEE 802.15.4 low-rate, low-power packet transmissions experience statistical correlation between channel errors due to interference and multipath fading. The 802.15.4 MAC layer implements an ARQ (Automatic Repeat-Request) mechanism for error recovery. In this work, we investigate the impact of correlated errors on the ARQ mechanism. The MAC layer back-off strategy employs a uniform random distribution to choose back-off values; which often reduces retransmission resolution time when packets confront collisions or transmission errors. We therefore propose the application of non-uniform (skewed) distribution which improves the system performance. Furthermore, an adaptive back off strategy, fastEI-slowED is developed for IEEE 802.15.4 MAC protocol to combat channel errors in time varying conditions. A detailed comparative analysis is presented employing accurate models of wireless channel and MAC protocol. Numerical results indicate that proposed scheme performs better, especially in worst channel conditions, when long duration error bursts are more frequent.
  • Keywords
    Zigbee; access protocols; fading channels; radiofrequency interference; ARQ mechanism; IEEE 802.15.4 MAC layer back-off strategy; IEEE 802.15.4 MAC protocol; combat correlated channel errors; indoor environment; multipath fading; statistical correlation; Fading; IEEE 802.15 Standards; Markov processes; Media Access Protocol; Reliability; Shape; Wireless communication; IEEE802.15.4; MAC; fading; skewed distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    World of Wireless, Mobile and Multimedia Networks (WoWMoM), 2011 IEEE International Symposium on a
  • Conference_Location
    Lucca
  • Print_ISBN
    978-1-4577-0352-2
  • Electronic_ISBN
    978-1-4577-0350-8
  • Type

    conf

  • DOI
    10.1109/WoWMoM.2011.5986472
  • Filename
    5986472