Title :
A model for electrical tree growth in solid insulating materials using cellular automata
Author :
Danikas, M.G. ; Karafyllidis, I. ; Thanailakis, A. ; Bruning, A.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece
Abstract :
Models proposed to explain the breakdown mechanisms of the solid insulating materials are based, among others, on electromagnetic theory, avalanche theory and fractals. In this paper the breakdown of insulating materials is simulated using von Neumann´s Cellular Automata (CAs). An algorithm for solid dielectric breakdown simulation based on CAs is presented with a point/plane electrode arrangement. The algorithm is also used to simulate breakdown in a solid dielectric having a spherical void
Keywords :
cellular automata; electric breakdown; electrodes; insulation; trees (electrical); voids (solid); avalanche theory; breakdown mechanisms; cellular automata; electrical tree growth; electromagnetic theory; fractals; point/plane electrode arrangement; solid dielectric breakdown simulation; solid insulating materials; spherical void; von Neumann´s Cellular Automata; Avalanche breakdown; Biological materials; Content addressable storage; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electromagnetic modeling; Fractals; Solid modeling; Trees - insulation;
Conference_Titel :
Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-3531-7
DOI :
10.1109/ELINSL.1996.549484
