A model for electrical tree growth in solid insulating materials using cellular automata

Author

Danikas, M.G. ; Karafyllidis, I. ; Thanailakis, A. ; Bruning, A.M.

Author_Institution

Dept. of Electr. & Comput. Eng., Democritus Univ. of Thrace, Xanthi, Greece

Volume

2

fYear

1996

fDate

16-19 Jun 1996

Firstpage

887

Abstract

Models proposed to explain the breakdown mechanisms of the solid insulating materials are based, among others, on electromagnetic theory, avalanche theory and fractals. In this paper the breakdown of insulating materials is simulated using von Neumann´s Cellular Automata (CAs). An algorithm for solid dielectric breakdown simulation based on CAs is presented with a point/plane electrode arrangement. The algorithm is also used to simulate breakdown in a solid dielectric having a spherical void

Keywords

cellular automata; electric breakdown; electrodes; insulation; trees (electrical); voids (solid); avalanche theory; breakdown mechanisms; cellular automata; electrical tree growth; electromagnetic theory; fractals; point/plane electrode arrangement; solid dielectric breakdown simulation; solid insulating materials; spherical void; von Neumann´s Cellular Automata; Avalanche breakdown; Biological materials; Content addressable storage; Dielectric breakdown; Dielectric materials; Dielectrics and electrical insulation; Electromagnetic modeling; Fractals; Solid modeling; Trees - insulation;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, 1996., Conference Record of the 1996 IEEE International Symposium on

Conference_Location

Montreal, Que.

ISSN

1089-084X

Print_ISBN

0-7803-3531-7

Type

conf

DOI

10.1109/ELINSL.1996.549484

Filename

549484