DocumentCode :
2787342
Title :
Reliability of high power MQW-DFB-DC-PBH-LDs for Coherent Optical Communication System Application
Author :
Kitamura, M. ; Yamazaki, H. ; Yamada, H. ; Takano, S. ; Kosuge, K. ; Yamaguchi, M. ; Mito, I.
Author_Institution :
NEC CORP.
fYear :
1992
fDate :
21-25 Sept. 1992
Firstpage :
260
Lastpage :
261
Abstract :
Result of aging test for 1.55/spl mu/m MQW-DFB-DC-PBH-LDs, in terms of spectral linewidth, FM characteristics and lasing wavelength, is reported. Over 10/sup 5/ hours reliability was estimated from long term aging and accelerated aging tests.
Keywords :
Accelerated aging; Degradation; Frequency modulation; National electric code; Optical fiber communication; Power generation; Power system reliability; Quantum well devices; Testing; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Laser Conference , 1992. Conference Digest. 13th IEEE International
Conference_Location :
Kagazwa, Japan
Print_ISBN :
4-930813-51-4
Type :
conf
DOI :
10.1109/ISLC.1992.763662
Filename :
763662
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2787342
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