• DocumentCode
    2787506
  • Title

    A V-band divide-by-three differential direct injection-locked frequency divider in 65-nm CMOS

  • Author

    Hsieh, Hsieh-Hung ; Hsueh, Fu-Lung ; Jou, Chewn-Pu ; Kuo, Fred ; Chen, Sean ; Yeh, Tzu-Jin ; Tan, Kevin Kai-Wen ; Wu, Po-Yi ; Lin, Yu-Ling ; Tsai, Ming-Hsien

  • Author_Institution
    Design Technol. Div., Taiwan Semicond. Manuf. Co., Ltd., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    19-22 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper, a novel circuit topology of CMOS divide-by-three injection-locked frequency divider is demonstrated. By using a differential direct injection pair with a LC-tank oscillator, the proposed circuit can perform the division ratio of three while the wide locking range is obtained. Based on the presented circuit architecture, a V-band frequency divider is implemented in 65-nm CMOS for demonstration. Operated at a supply voltage of 1.0 V, the divider core consumes a dc power of 5.2 mW. At an incident power of 0 dBm, the fabricated circuit exhibits an input locking range from 58.6 to 67.2 GHz. The measured output power and locked phase noise at a 1-MHz offset are -10 dBm and -127 dBc/Hz, respectively. To the authors´ best knowledge, this work is the first CMOS V-band divide-by-three injection-locked frequency divider owning a locking range over 10% without any tuning mechanism reported to date.
  • Keywords
    CMOS integrated circuits; frequency dividers; injection locked oscillators; phase noise; CMOS V-band divide-by-three injection-locked frequency divider; CMOS divide-by-three injection-locked frequency divider; LC-tank oscillator; V-band divide-by-three differential direct injection-locked frequency divider; V-band frequency divider; circuit architecture; circuit topology; differential direct injection pair; fabricated circuit; input locking range; locked phase noise; power 5.2 mW; size 65 nm; supply voltage; tuning mechanism; voltage 1 V; Band pass filters; CMOS integrated circuits; Conferences; Frequency conversion; Frequency measurement; Phase noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2010 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4244-5758-8
  • Type

    conf

  • DOI
    10.1109/CICC.2010.5617391
  • Filename
    5617391