DocumentCode
2787574
Title
rPRAM: Exploring Redundancy Techniques to Improve Lifetime of PCM-based Main Memory
Author
Chen, Jie ; Winter, Zachary ; Venkataramani, Guru ; Huang, H. Howie
Author_Institution
Dept. of Electr. & Comput. Eng., George Washington Univ., Washington, DC, USA
fYear
2011
fDate
10-14 Oct. 2011
Firstpage
201
Lastpage
202
Abstract
Future main memory systems will confront the scaling challenges posed by DRAM technology and should adapt themselves to use the emerging memory technologies like Phase Change Memory (PCM, or PRAM). PCM offers advantages such as storage density, non-volatility, and lower energy consumption. However, they are constrained by limited write endurance and reduced performance. In this paper, we propose a novel PCM-based main memory system, rPRAM, that explores advanced redundancy techniques to resuscitate faulty PCM pages and reuse these pages to store data. Our preliminary experiments show that rPRAM has the potential to extend the lifetime of PCM based memory commensurate with the existing schemes like ECP, while incurring only a negligible fraction of hardware cost compared to ECP.
Keywords
DRAM chips; concurrency theory; multiprocessing systems; phase change memories; redundancy; DRAM technology; PCM-based main memory; faulty PCM page; lower energy consumption; phase change memory; rPRAM; redundancy technique; storage density; Hardware; Phase change materials; Phase change random access memory; Redundancy; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Parallel Architectures and Compilation Techniques (PACT), 2011 International Conference on
Conference_Location
Galveston, TX
ISSN
1089-795X
Print_ISBN
978-1-4577-1794-9
Type
conf
DOI
10.1109/PACT.2011.40
Filename
6113815
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