Title :
Scattering by a thick impedance half plane
Author :
Volakis, John L.
Author_Institution :
University of Michigan, Ann Arbor, MI, USA
Keywords :
Boundary conditions; Couplings; Current; Diffraction; Geometry; Laboratories; Magnetic analysis; Reflection; Scattering; Surface impedance;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1986
Conference_Location :
Philadelphia, PA, USA
DOI :
10.1109/APS.1986.1149811
