• DocumentCode
    2787865
  • Title

    An 8-bit 1.5GS/s flash ADC using post-manufacturing statistical selection

  • Author

    Proesel, Jonathan ; Keskin, Gokce ; Plouchart, Jean-Olivier ; Pileggi, Lawrence

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2010
  • fDate
    19-22 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    An 8-bit, 1.5GS/s flash ADC is presented. Comparators are digitally calibrated using statistical selection. INL of 1.32 LSB and DNL of 1.23 LSB are achieved. Average comparator noise of 5mVrms (1.3 LSB) limits SNDR to 37dB at low frequencies. Total power is 35mW, 20mW in the S&H and 15mW in the ADC core. The figure of merit is 0.42pJ/conv, the best reported for 1+GS/s, 7+-bit ADCs.
  • Keywords
    analogue-digital conversion; circuit noise; comparators (circuits); ADC core; comparators; flash ADC; post-manufacturing statistical selection; power 15 mW; power 20 mW; power 35 mW; word length 8 bit; CMOS integrated circuits; Calibration; Clocks; Noise; Redundancy; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2010 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4244-5758-8
  • Type

    conf

  • DOI
    10.1109/CICC.2010.5617410
  • Filename
    5617410