• DocumentCode
    2787972
  • Title

    Detection of gold in the facet of a failed semiconductor laser diode

  • Author

    Chaney, J.A. ; Yeoh, T.S. ; Ives, N.A. ; Leung, M.S. ; Feinberg, Z.D. ; Ho, J.G.

  • Author_Institution
    The Aerospace Corporation, 2350 E. El Segundo Blvd, CA 90245, USA
  • fYear
    2007
  • fDate
    6-11 May 2007
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The damaged region of a failed semiconductor laser diode was analyzed using FIB nanotomography and 31) TOF-SIMS. Gold, a deep level trap, was found between the antireflective coating and the semiconductor facet.
  • Keywords
    Chemicals; Coatings; Diode lasers; Face detection; Focusing; Gold; Optical materials; Phase change materials; Semiconductor lasers; Semiconductor materials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 2007. QELS '07
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    978-1-55752-834-6
  • Type

    conf

  • DOI
    10.1109/QELS.2007.4431370
  • Filename
    4431370
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2787972