Title :
Detection of gold in the facet of a failed semiconductor laser diode
Author :
Chaney, J.A. ; Yeoh, T.S. ; Ives, N.A. ; Leung, M.S. ; Feinberg, Z.D. ; Ho, J.G.
Author_Institution :
The Aerospace Corporation, 2350 E. El Segundo Blvd, CA 90245, USA
Abstract :
The damaged region of a failed semiconductor laser diode was analyzed using FIB nanotomography and 31) TOF-SIMS. Gold, a deep level trap, was found between the antireflective coating and the semiconductor facet.
Keywords :
Chemicals; Coatings; Diode lasers; Face detection; Focusing; Gold; Optical materials; Phase change materials; Semiconductor lasers; Semiconductor materials;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 2007. QELS '07
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
978-1-55752-834-6
DOI :
10.1109/QELS.2007.4431370
