DocumentCode
2788183
Title
Fault Injection for Semi-Parametric Reliability Models
Author
White, Allan L.
Author_Institution
NASA Langley, Hampton, VA
fYear
2005
fDate
5-12 March 2005
Firstpage
1
Lastpage
20
Abstract
A new result about the reliability models of reconfigurable digital systems is derived and then applied to the problem of establishing ultra reliability by fault injection experiments. The result shows that the complicated fault recovery procedure can be adequately described by a few parameters. The resulting reduction in modeling and experimental effort brings establishing extremely low probabilities of failure within experimental reach. There is a discussion of the differences between this approach and previous efforts. The result is used to design experiments for several example systems
Keywords
aerospace control; digital control; reliability; system recovery; fault injection; fault recovery procedure; reconfigurable digital systems; semiparametric reliability models; Digital control; Digital systems; Government; NASA; Parameter estimation; Parametric statistics; Protection; Reliability; System recovery; Upper bound;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2005 IEEE
Conference_Location
Big Sky, MT
Print_ISBN
0-7803-8870-4
Type
conf
DOI
10.1109/AERO.2005.1559344
Filename
1559344
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