Title :
Current sensing MOSFETs for protection and control
Author :
Grant, D.A. ; Williams, R.
Author_Institution :
Dept. of Electr. & Electron. Eng., Bristol Univ., UK
Abstract :
Discusses problems which have caused difficulties in high frequency switching systems such as switched mode power supplies, the amount of noise, or apparently spurious transients, occurring in the current signal at the moments of switching. This paper looks at the origin of these transients or spikes. The spikes appearing in the current sense signal when a current-sensing MOSFET is switched can be due to measurement difficulties but there are also real limitations associated with the means by which the sense current is converted to a voltage and with the way in which the device is packaged
Keywords :
insulated gate field effect transistors; random noise; switched mode power supplies; transients; current sense signal; current signal; current-sensing MOSFET; high frequency switching systems; noise; spikes; spurious transients; switched mode power supplies;
Conference_Titel :
Measurement Techniques for Power Electronics, IEE Colloquium on
Conference_Location :
London
