Title :
1.5-GHz CMOS voltage-controlled oscillator based on thickness-field-excited piezoelectric AlN contour-mode MEMS resonators
Author :
Zuo, Chengjie ; Van der Spiegel, Jan ; Piazza, Gianluca
Author_Institution :
Dept. of Electr. & Syst. Eng., Univ. of Pennsylvania, Philadelphia, PA, USA
Abstract :
This paper reports on the first demonstration of a 1.5 GHz CMOS oscillator based on thickness-field-excited (TFE) piezoelectric AlN MEMS contour-mode resonators (CMRs). The measured phase noise is -85 dBc/Hz at 10 kHz offset frequency and -151 dBc/Hz at 1 MHz. This is the highest frequency MEMS oscillator ever reported using a laterally vibrating mechanical resonator. The high frequency operation has been enabled by optimizing the geometrical design and micro-fabrication process of TFE AlN CMRs, so that a low effective motional resistance around 50 Ω is achieved together with a high unloaded quality factor (Qu) approaching 2500 and simultaneously high kt2 up to 1.96%. A tunable-supply oscillator design is proposed for fine frequency tuning (or trimming) over a narrow bandwidth. The circuit design enables a novel GHz voltage-controlled oscillator (VCO) without the use of any low-Q tunable component. The 1.5 GHz VCO exhibits a 1500 ppm tuning range by a DC voltage change of 2.5 V. This technique can be utilized for fine frequency trimming and temperature compensation applications.
Keywords :
CMOS integrated circuits; aluminium compounds; crystal resonators; micromechanical resonators; voltage-controlled oscillators; CMOS voltage-controlled oscillator; DC voltage; TFE AlN CMR microfabrication process; fine frequency trimming; fine frequency tuning; frequency 10 kHz to 1.5 GHz; laterally vibrating mechanical resonator; low-g tunable component; phase noise; temperature compensation application; thickness-field-excited piezoelectric AlN contour-mode MEMS resonators; tunable-supply oscillator design; voltage 2.5 V; Micromechanical devices; Phase noise; Resistance; Resonant frequency; Tuning; Voltage-controlled oscillators;
Conference_Titel :
Custom Integrated Circuits Conference (CICC), 2010 IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-5758-8
DOI :
10.1109/CICC.2010.5617432