• DocumentCode
    2788478
  • Title

    A 10 GHz frequency-drift temperature compensated LC VCO with fast-settling low-noise voltage regulator in 0.13 µm CMOS

  • Author

    Akima, Hiroshi ; Dec, Aleksander ; Merkin, Timothy ; Suyama, Ken

  • Author_Institution
    Epoch Microelectron., Inc., Tarrytown, NY, USA
  • fYear
    2010
  • fDate
    19-22 Sept. 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents an LC voltage controlled oscillator (VCO) with an integrated compensation circuit that reduces oscillation frequency drift due to temperature variations. The temperature compensation circuit consists of MOS inversion varactor as a compensation capacitor, and BJTs and resistors for temperature dependent voltage bias generation, and noise contribution suppression of a bias noise. The effectiveness of this technique is demonstrated in a 10 GHz LC VCO with a frequency divider (divide-by-2), output measurement buffer, and integrated fast-settling low-noise voltage regulator. The VCO achieves current consumption of 21.0 mA, tuning range of 10.68 GHz to 12.40 GHz, phase noise of - 109.9 dBc/Hz at 1 MHz offset from 6.12 GHz carrier. The VCO frequency-drift due to temperature is improved by 82 % with the compensation circuit.
  • Keywords
    CMOS analogue integrated circuits; MMIC oscillators; frequency dividers; voltage-controlled oscillators; BJT; CMOS; LC voltage controlled oscillator; MOS inversion varactor; VCO; compensation capacitor; current 21 mA; fast-settling low-noise voltage regulator; frequency 1 MHz; frequency 10 GHz; frequency 10.68 GHz to 12.40 GHz; frequency 6.12 GHz; frequency divider; integrated compensation circuit; measurement buffer; resistors; size 0.13 mum; temperature compensation circuit; temperature dependent voltage; temperature variations; Frequency measurement; Phase noise; Temperature measurement; Tuning; Varactors; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2010 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4244-5758-8
  • Type

    conf

  • DOI
    10.1109/CICC.2010.5617448
  • Filename
    5617448