DocumentCode :
2788535
Title :
Improve the Effectiveness of Test Case Generation on EFSM via Automatic Path Feasibility Analysis
Author :
Yang, Rui ; Chen, Zhenyu ; Xu, Baowen ; Wong, W. Eric ; Zhang, Jie
Author_Institution :
State Key Lab. for Novel Software Technol., Nanjing Univ., Nanjing, China
fYear :
2011
fDate :
10-12 Nov. 2011
Firstpage :
17
Lastpage :
24
Abstract :
A typical approach utilized for automated test case generation is to create a model of the implementation under test. Extended Finite State Machine (EFSM) is among the most popular models for model-based testing. However, automated test case generation on EFSM models is still a challenge task as a result of the fact that an EFSM model may contain infeasible paths. In this article we present a novel approach that combines static analysis and dynamic analysis techniques to address the problems of path infeasibility in the process of test case generation on EFSM models. A metric is presented for the purpose of finding a path subset that has few paths, long path length and goodness feasibility to meet adequacy coverage criteria. In addition, we develop an executable model to obtain run-time information feedback and introduce the Scatter Search into test case generation. Based on the executable model, the expected outputs associated with test data are also collected for construction of test oracles automatically. The experimental results show that our approach has good effectiveness for test case generation on EFSM models, and the method that combines static analysis and dynamic analysis can speed up the process of test case generation greatly.
Keywords :
finite state machines; program testing; automated test case generation; automatic path feasibility analysis; dynamic analysis; extended finite state machine; run-time information feedback; scatter search; static analysis; Analytical models; Context; Data models; Educational institutions; Measurement; Testing; EFSM model-based testing; executable model; path feasibility analysis; test case generation; test oracle;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
High-Assurance Systems Engineering (HASE), 2011 IEEE 13th International Symposium on
Conference_Location :
Boca Raton, FL
ISSN :
1530-2059
Print_ISBN :
978-1-4673-0107-7
Type :
conf
DOI :
10.1109/HASE.2011.12
Filename :
6113868
Link To Document :
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