DocumentCode :
27887
Title :
Accurate Analytical Modeling for Switching Energy of PiN Diodes Reverse Recovery
Author :
Jahdi, Saeed ; Alatise, Olayiwola ; Li Ran ; Mawby, Philip
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Warwick, Coventry, UK
Volume :
62
Issue :
3
fYear :
2015
fDate :
Mar-15
Firstpage :
1461
Lastpage :
1470
Abstract :
PiN diodes are known to significantly contribute to switching energy as a result of reverse-recovery charge during turn-off. At high switching rates, the overlap between the high peak reserve-recovery current and the high peak voltage overshoot contributes to significant switching energy. The peak reverse-recovery current depends on the temperature and switching rate, whereas the peak diode voltage overshoot depends additionally on the stray inductance. Furthermore, the slope of the diode turn-off current is constant at high insulated-gate bipolar transistor (IGBT) switching rates and varies for low IGBT switching rates. In this paper, an analytical model for calculating PiN diode switching energy at different switching rates and temperatures is presented and validated by ultrafast and standard recovery diodes with different current ratings. Measurements of current commutation in IGBT/PiN diode pairs have been made at different switching rates and temperatures and used to validate the model. It is shown here that there is an optimal switching rate to minimize switching energy. The model is able to correctly predict the switching rate and temperature dependence of the PiN diode switching energies for different devices.
Keywords :
p-i-n diodes; power semiconductor switches; semiconductor device models; IGBT; analytical modeling; current commutation measurements; diode turn-off current; high insulated-gate bipolar transistor switching rates; high peak diode voltage overshoot; high peak reserve-recovery current; pin diodes reverse recovery; stray inductance; switching energy; Current measurement; Insulated gate bipolar transistors; Logic gates; PIN photodiodes; Switches; Temperature dependence; Temperature measurement; Analytical modeling; PiN diodes; reverse recovery; switching energy; switching transient;
fLanguage :
English
Journal_Title :
Industrial Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0046
Type :
jour
DOI :
10.1109/TIE.2014.2347936
Filename :
6878448
Link To Document :
بازگشت