Title :
SEE sensitivity determination of high-density DRAMs with limited-range heavy ions
Author :
Koga, R. ; Crain, S.H. ; Yu, P. ; Crawford, K.B.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
Abstract :
We have devised ways to measure the SEE sensitivity of plastic-encapsulated, high-density DRAMs with the use of limited-range heavy ions. The sensitivity at low LET regions is verified using a few species of ions with a long range
Keywords :
DRAM chips; ion beam effects; LET; SEE sensitivity; heavy ion irradiation; high-density DRAM; plastic encapsulation; range; Aerospace testing; Cyclotrons; Inorganic materials; Laboratories; Lead; Plastics; Random access memory; SDRAM; Telephony; Timing;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896268
