Title :
Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators
Author :
Koga, R. ; Crain, S.H. ; Crawford, K.B. ; Moss, S.C. ; LaLumondiere, S.D. ; Howard, J.W., Jr.
Author_Institution :
Aerosp. Corp., Los Angeles, CA, USA
Abstract :
The single event transient (SET) sensitivity of a radiation hardened voltage comparator type with vertical input transistors is compared with that observed for a COTS device type made up of lateral transistors. The cause of the difference in sensitivity is investigated
Keywords :
comparators (circuits); radiation hardening (electronics); COTS voltage comparator; lateral transistor; radiation hardening; single event transient sensitivity; vertical transistor; Circuit testing; Instruments; Operational amplifiers; Radiation hardening; Semiconductor diodes; Silicon on insulator technology; Single event upset; Space vector pulse width modulation; Telephony; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896269
