Title :
Comparison of flight and ground data for radiation-induced high current states in the 68302 microprocessor
Author :
Crain, Susan H. ; La Lumondiere, Stephen D. ; Miller, Stephen W. ; Crain, William R. ; Crawford, Kirk B. ; Hansel, Steven J. ; Koga, R. ; Moss, Steven C.
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
Abstract :
It has been observed that the 68302 microprocessor, which is being flown on several space vehicles, has not shown signs of experiencing either single event latchup (SEL) or single event snapback (SES) as would have been predicted using ground-based test data. This study presents the comparison of the flight to ground data
Keywords :
ion beam effects; microprocessor chips; space vehicle electronics; 68302 microprocessor; flight test; ground test; heavy ion irradiation; high current state; single event latchup; single event snapback; space vehicle; Aerospace testing; Argon; Artificial satellites; Circuit testing; Helium; Kirk field collapse effect; Microprocessors; Single event upset; Space vehicles; Telephony;
Conference_Titel :
Radiation Effects Data Workshop, 2000
Conference_Location :
Reno, NV
Print_ISBN :
0-7803-6474-0
DOI :
10.1109/REDW.2000.896275
