Title :
Optimal spare allocation for defect-tolerant VLSI
Author :
Shi, Weiping ; Fuchs, W. Kent
Author_Institution :
Illinois Univ., Urbana, IL, USA
Abstract :
The authors study the problem of allocating spares to specific fault-tolerant VLSI/WSI (wafer scale integration) designs to maximize the global yield. Four problems are examined: (1) the optimal yield problem for k-out-of-n systems; (2) the optimal partition of elements; (3) spare allocation for trees; and (4) spare allocations for row/column reconfiguration systems
Keywords :
VLSI; redundancy; reliability theory; WSI; defect-tolerant VLSI; fault tolerant chips; global yield; k-out-of-n systems; optimal partition of elements; optimal spare allocation; optimal yield problem; row/column reconfiguration systems; spare allocation for trees; spare allocations; wafer scale integration; Algorithm design and analysis; Chebyshev approximation; Conference management; Contracts; Distributed computing; Partitioning algorithms; Random variables; Reactive power; Very large scale integration; Wafer scale integration;
Conference_Titel :
Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on
Conference_Location :
San Francisco, CA
Print_ISBN :
0-8186-2482-5
DOI :
10.1109/ICWSI.1992.171811
