Optimal spare allocation for defect-tolerant VLSI

Author

Shi, Weiping ; Fuchs, W. Kent

Author_Institution

Illinois Univ., Urbana, IL, USA

fYear

1992

fDate

22-24 Jan 1992

Firstpage

193

Lastpage

199

Abstract

The authors study the problem of allocating spares to specific fault-tolerant VLSI/WSI (wafer scale integration) designs to maximize the global yield. Four problems are examined: (1) the optimal yield problem for k-out-of-n systems; (2) the optimal partition of elements; (3) spare allocation for trees; and (4) spare allocations for row/column reconfiguration systems

Keywords

VLSI; redundancy; reliability theory; WSI; defect-tolerant VLSI; fault tolerant chips; global yield; k-out-of-n systems; optimal partition of elements; optimal spare allocation; optimal yield problem; row/column reconfiguration systems; spare allocation for trees; spare allocations; wafer scale integration; Algorithm design and analysis; Chebyshev approximation; Conference management; Contracts; Distributed computing; Partitioning algorithms; Random variables; Reactive power; Very large scale integration; Wafer scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Wafer Scale Integration, 1992. Proceedings., [4th] International Conference on

Conference_Location

San Francisco, CA

Print_ISBN

0-8186-2482-5

Type

conf

DOI

10.1109/ICWSI.1992.171811

Filename

171811

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2788891