DocumentCode
2789129
Title
High-Assurance Reconfigurable Multicore Processor Based Systems
Author
Peshave, Manasi ; Bastani, Farokh B. ; Yen, I-Ling
Author_Institution
Dept. of Comput. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
fYear
2011
fDate
10-12 Nov. 2011
Firstpage
220
Lastpage
226
Abstract
The current trend in the silicon industry has been a steady migration towards Chip Multicore Processor (CMP) system to harvest more throughputs. However, chip multicore processors report higher values of soft errors, thereby degrading the overall system reliability. Hence, engineers have been wary of using CMP architectures for safety-critical embedded real-time system applications that require high reliability levels. The larger users of these processors also dictate the processor migration trends. With newer processor architectures, the older ones are destined to become obsolete. This paper compares typical safety-critical architectures and investigates the reliabilities of different CMP architectures. We present the fault tolerance framework and detailed reliability analysis of fault-tolerant single-core and multi-core based systems. The analysis results are then used to compare the reliability of CMP architectures with the corresponding reliability of single processor architectures. Although a CMP system does encounter degradation, by applying some system level dependability assurance mitigation features, its reliability can be enhanced. This enables CMP systems to be effectively deployed in critical applications.
Keywords
embedded systems; fault tolerant computing; microprocessor chips; multiprocessing systems; reconfigurable architectures; reliability; chip multicore processor system; fault tolerance framework; fault tolerant single core systems; high assurance reconfigurable multicore processor based systems; reliability analysis; safety critical embedded real time system applications; silicon industry; soft errors; system level dependability assurance mitigation features; system reliability; Industries; Markov processes; Multicore processing; Redundancy; Transient analysis; Markov model; Multicore; Reconfigurable Chip Multicore Processors (CMP); Reliabiltiy; Soft Errors; Transient faults;
fLanguage
English
Publisher
ieee
Conference_Titel
High-Assurance Systems Engineering (HASE), 2011 IEEE 13th International Symposium on
Conference_Location
Boca Raton, FL
ISSN
1530-2059
Print_ISBN
978-1-4673-0107-7
Type
conf
DOI
10.1109/HASE.2011.33
Filename
6113901
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