• DocumentCode
    2789129
  • Title

    High-Assurance Reconfigurable Multicore Processor Based Systems

  • Author

    Peshave, Manasi ; Bastani, Farokh B. ; Yen, I-Ling

  • Author_Institution
    Dept. of Comput. Eng., Univ. of Texas at Dallas, Richardson, TX, USA
  • fYear
    2011
  • fDate
    10-12 Nov. 2011
  • Firstpage
    220
  • Lastpage
    226
  • Abstract
    The current trend in the silicon industry has been a steady migration towards Chip Multicore Processor (CMP) system to harvest more throughputs. However, chip multicore processors report higher values of soft errors, thereby degrading the overall system reliability. Hence, engineers have been wary of using CMP architectures for safety-critical embedded real-time system applications that require high reliability levels. The larger users of these processors also dictate the processor migration trends. With newer processor architectures, the older ones are destined to become obsolete. This paper compares typical safety-critical architectures and investigates the reliabilities of different CMP architectures. We present the fault tolerance framework and detailed reliability analysis of fault-tolerant single-core and multi-core based systems. The analysis results are then used to compare the reliability of CMP architectures with the corresponding reliability of single processor architectures. Although a CMP system does encounter degradation, by applying some system level dependability assurance mitigation features, its reliability can be enhanced. This enables CMP systems to be effectively deployed in critical applications.
  • Keywords
    embedded systems; fault tolerant computing; microprocessor chips; multiprocessing systems; reconfigurable architectures; reliability; chip multicore processor system; fault tolerance framework; fault tolerant single core systems; high assurance reconfigurable multicore processor based systems; reliability analysis; safety critical embedded real time system applications; silicon industry; soft errors; system level dependability assurance mitigation features; system reliability; Industries; Markov processes; Multicore processing; Redundancy; Transient analysis; Markov model; Multicore; Reconfigurable Chip Multicore Processors (CMP); Reliabiltiy; Soft Errors; Transient faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High-Assurance Systems Engineering (HASE), 2011 IEEE 13th International Symposium on
  • Conference_Location
    Boca Raton, FL
  • ISSN
    1530-2059
  • Print_ISBN
    978-1-4673-0107-7
  • Type

    conf

  • DOI
    10.1109/HASE.2011.33
  • Filename
    6113901