Title :
The influence of the distributed trapped charge on VFTO
Author :
Yu, Hongyang ; Lu, Binxian
Author_Institution :
Sch. of Electr. & Electron. Eng., North China Electr. Power Univ., Beijing, China
Abstract :
In this paper, the nodal admittance equation is derived for analyzing the response of the transmission line under the residual voltage due to uniformly distributed charge along the line in Laplace domain. We equivalent the trapped charge to the current sources which are located at near-end and far-end when the disconnector switching is operated. Based on the Numerical Inverse Laplace Transform method, the response of the transmission line is solved. And the simulation results are compared with the simulations in EMTP to confirm that the formulation is correct. Based on the equation presented in this paper, several simulations have been studied. We simulate the effect of trapped charge with different magnitude on VFTO, and the effect of length of line on VFTO.
Keywords :
EMTP; Laplace transforms; electric admittance; overvoltage; power transmission lines; EMTP; Laplace domain; VFTO; current source; distributed trapped charge; inverse Laplace transform method; nodal admittance equation; residual voltage; transmission line; very fast transient overvoltage; EMTP; Equations; Equivalent circuits; Mathematical model; Numerical models; Power transmission lines; GIS; VFTO; transmission line; trapped charge;
Conference_Titel :
Critical Infrastructure (CRIS), 2010 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8080-7
DOI :
10.1109/CRIS.2010.5617488