DocumentCode :
2789416
Title :
Transient electromagnetic wave analysis method based on complex domain projection
Author :
Pan Chao ; Wang Zezhong ; Shang Kangliang ; Dong Bo ; Fang Jingtao
Author_Institution :
Sch. of Electr. Eng., North China Electr. Power Univ., Beijing, China
fYear :
2010
fDate :
20-22 Sept. 2010
Firstpage :
1
Lastpage :
5
Abstract :
A complex domain projection method of analysis is proposed based on the transient representation of electro-magnetic traveling wave (EM) for transmission line. Considering the impact of distributed parameters and the characteristics of electro-magnetic wave, the transmission line model is built. The instantaneous voltage equation and the fault location function are derived and obtained and the former is researched for complex domain projection, which is the improvement of orthogonal projection. And the voltage is approached exactly. The edge effect caused by orthogonal scaling function is solved. Complex orthogonal projection transformation can not be affected by the calculation step, which takes advantages of algebra instead and time-invariant matrix Z0 and Y0, as to speed calculating offline. In addition, diagonalization of H is simple and obvious with sparsity. Without convolution, the efficiency and accuracy has been proved, and the adaptive calculation for the sampling frequency through simulation and analysis.
Keywords :
fault location; power system transients; power transmission lines; transient analysis; complex domain projection; edge effect; electromagnetic traveling wave; fault location function; instantaneous voltage equation; orthogonal projection; orthogonal scaling function; time-invariant matrix; transient electromagnetic wave analysis; transmission line model; Equations; Fault location; Integrated circuit modeling; Mathematical model; Power transmission lines; Transient analysis; complex domain projection; distributed parameter; electromagnetic wave; orthogonal scaling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Critical Infrastructure (CRIS), 2010 5th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-8080-7
Type :
conf
DOI :
10.1109/CRIS.2010.5617501
Filename :
5617501
Link To Document :
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