DocumentCode
2790008
Title
Far-infrared magneto-optical resonance as a fundamental method of semiconductor characterization - state of the art
Author
Otsuka, E.
Author_Institution
Osaka University
fYear
1989
fDate
0-0 1989
Firstpage
307
Lastpage
310
Abstract
Time-resolved cyclotron resonance, intensity and linewidth measurement, as well as impurity Zeeman transition observa tion, with and without photoexcitation, may determine the quality of a semiconductor, leading to possible recommendation of crystal growth method.
Keywords
Cyclotrons; Electrons; Magnetic field measurement; Magnetic resonance; Magnetooptic effects; Neodymium; Photonic band gap; Semiconductor impurities; Semiconductor materials; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
Conference_Location
Beijing, China
Print_ISBN
0-87942-717-5
Type
conf
DOI
10.1109/ICMWFT.1989.763833
Filename
763833
Link To Document