Title :
Measurement of two-port networks by a single six-port reflectometer
Author_Institution :
Southeast University
Abstract :
In this paper, a measuring method of two-port network by a single six-port reflectometer is proposed . The four scattering parameters are divided into two groups so that they can be measured more easily. Calibration is convenient . The experimental results at Ka-band show that this method has higher accuracy.
Keywords :
Calibration; Circuits; Directional couplers; Isolators; Measurement standards; Q measurement; Reflection; Scattering parameters; Size measurement; Turning;
Conference_Titel :
Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-87942-717-5
DOI :
10.1109/ICMWFT.1989.763851
