DocumentCode
2790553
Title
Formal verification guided automatic design error diagnosis and correction of complex processors
Author
Gharehbaghi, Amir Masoud ; Fujita, Masahiro
Author_Institution
VLSI Design & Educ. Center, Univ. of Tokyo, Tokyo, Japan
fYear
2011
fDate
9-11 Nov. 2011
Firstpage
121
Lastpage
127
Abstract
In this paper we present a method to automatically debug and correct design errors of modern microprocessors. Given a golden sequential model of the processor and the erroneous cycle-accurate model of superscalar out-of-order processors, we employ a multiplexer-based method, which has been used for RTL/gate-level designs, to formally identify the candidate locations for the errors/bugs along with a counter example to guide the error correction mechanism. By analyzing the design and the generated candidate locations and the corresponding counter example, we automatically generate a set of potential solutions to correct the error. Finally, the potential solutions are formally verified against the golden model until the error is corrected. To show the effectiveness of our method, we have chosen a complex out-of-order superscalar processor with timing error recovery mechanisms as our case study. We have injected a number of bugs in the processor model and could successfully find the bugs and also their corresponding fixes.
Keywords
formal verification; microprocessor chips; RTL-gate-level designs; automatic design error correction; automatic design error diagnosis; complex processors; cycle-accurate model; formal verification; microprocessors; multiplexer-based method; out-of-order superscalar processor; processor golden sequential model; superscalar out-of-order processors; timing error recovery mechanisms; Boolean functions; Error correction; Logic gates; Multiplexing; Program processors; Radiation detectors; Vectors; design error diagnosis and correction (DEDC); formal verification; micro architecture debugging; microprocessor;
fLanguage
English
Publisher
ieee
Conference_Titel
High Level Design Validation and Test Workshop (HLDVT), 2011 IEEE International
Conference_Location
Napa Valley, CA
ISSN
1552-6674
Print_ISBN
978-1-4577-1744-4
Type
conf
DOI
10.1109/HLDVT.2011.6113987
Filename
6113987
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