DocumentCode :
2790750
Title :
A quasioptical impedance measurement in dielectric image line
Author :
Kikuchi, K.
Author_Institution :
National Defense Academy
fYear :
1989
fDate :
0-0 1989
Firstpage :
473
Lastpage :
476
Abstract :
A qusioptical impedance measure ment on dielectric image line is proposed. This methode is con sists of measuring a tilt angle and a axial ratio of the ellipti cally polarized wave to be radiated from small coupling aperture. The usefulness of impedance measurements in the dielectric image line is proved at 35GHz band and also, it was shown to be well-suited at frequency above 100GHz.
Keywords :
Apertures; Dielectric devices; Dielectric measurements; Goniometers; Impedance measurement; Magnetic field measurement; Millimeter wave measurements; Polarization; Reflection; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
Conference_Location :
Beijing, China
Print_ISBN :
0-87942-717-5
Type :
conf
DOI :
10.1109/ICMWFT.1989.763883
Filename :
763883
Link To Document :
بازگشت