DocumentCode
2790750
Title
A quasioptical impedance measurement in dielectric image line
Author
Kikuchi, K.
Author_Institution
National Defense Academy
fYear
1989
fDate
0-0 1989
Firstpage
473
Lastpage
476
Abstract
A qusioptical impedance measure ment on dielectric image line is proposed. This methode is con sists of measuring a tilt angle and a axial ratio of the ellipti cally polarized wave to be radiated from small coupling aperture. The usefulness of impedance measurements in the dielectric image line is proved at 35GHz band and also, it was shown to be well-suited at frequency above 100GHz.
Keywords
Apertures; Dielectric devices; Dielectric measurements; Goniometers; Impedance measurement; Magnetic field measurement; Millimeter wave measurements; Polarization; Reflection; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Millimeter Wave and Far-Infrared Technology, 1989. ICMWFT '89. International Conference on
Conference_Location
Beijing, China
Print_ISBN
0-87942-717-5
Type
conf
DOI
10.1109/ICMWFT.1989.763883
Filename
763883
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