• DocumentCode
    2790876
  • Title

    Miller factor for gate-level coupling delay calculation

  • Author

    Pinhong Chen ; Kirkpatrick, D.A. ; Keutzer, K.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
  • fYear
    2000
  • fDate
    5-9 Nov. 2000
  • Firstpage
    68
  • Lastpage
    74
  • Abstract
    In coupling delay computation, a Miller factor of more than 2/spl times/ may be necessary to account for active coupling capacitance when modeling the delay of deep submicron circuitry in the presence of active coupling capacitance. We propose an efficient method to estimate this factor such that the delay response of a decoupling circuit model can emulate the original coupling circuit. Under the assumptions of zero initial voltage, equal charge transfer, and 0.5V/sub DD/ as the switching threshold voltage, an upper bound of 3/spl times/ for maximum delay and a lower bound of -1/spl times/ for minimum delay can be proven. Efficient Newton-Raphson iteration is also proposed as a technique for computing the Miller factor or effective capacitance. This result is highly applicable to crosstalk coupling delay calculation in deep submicron gate-level static timing analysis. Detailed analysis and approximation are presented. SPICE simulations are demonstrated to show high correlation with these approximations.
  • Keywords
    SPICE; crosstalk; delays; logic CAD; timing; Miller factor; Newton-Raphson iteration; SPICE simulations; active coupling capacitance; coupling delay computation; crosstalk coupling delay calculation; deep submicron circuitry; deep submicron gate-level static timing analysis; gate-level coupling delay calculation; upper bound; zero initial voltage; Capacitance; Charge transfer; Coupling circuits; Crosstalk; Delay estimation; SPICE; Threshold voltage; Timing; Upper bound; Zero voltage switching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-6445-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.2000.896453
  • Filename
    896453