• DocumentCode
    2790929
  • Title

    An important factor for optimistic protocol on distributed systems: granularity

  • Author

    Choi, Eunmi ; Moon Jung Chung

  • Author_Institution
    Dept. of Comput. Sci., Michigan State Univ., East Lansing, MI, USA
  • fYear
    1995
  • fDate
    3-6 Dec 1995
  • Firstpage
    642
  • Lastpage
    649
  • Abstract
    Grain size, the amount of computations between communication points, is a quantity to be tuned appropriately depending on the characteristics of the underlying parallel and distributed machines, application problems, and simulation protocols. As target machines for optimistic protocol, the architectural characteristics of a cluster of DEC Alpha workstations are compared to the MasPar MP-2´s in view of parallel logic simulation. We study the effects of varying grain size on several performance metrics when more than one logical processes are assigned to a physical processor on distributed systems. We obtain analytic formulas for the total number of simulation cycles and the total execution time, and find the optimal grain sizes for several benchmark circuits when the number of processors varies. Our experimental results show that the grain size greatly affects the performance of parallel logic simulation on distributed systems, and the effects vary depending on the machine independent factors
  • Keywords
    DEC computers; circuit analysis computing; discrete event simulation; distributed processing; logic CAD; parallel processing; performance evaluation; DEC Alpha workstations; MasPar; application problems; benchmark circuits; computations; discrete event simulation; distributed machines; distributed systems; grain size; granularity; optimistic protocol; parallel logic simulation; parallel machines; performance metrics; simulation protocols; total execution time; Analytical models; Circuit simulation; Computational modeling; Concurrent computing; Distributed computing; Grain size; Logic; Measurement; Protocols; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference Proceedings, 1995. Winter
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-78033018-8
  • Type

    conf

  • DOI
    10.1109/WSC.1995.478839
  • Filename
    478839