Metallic samples investigated by using a scattering near field optical microscope

Author

Stanciu, George A. ; Stoichita, Catalin ; Hristu, Radu ; Stanciu, Stefan G. ; Tranca, Denis E.

Author_Institution

Center for Microscopy, Microanal. & Inf. Process., Univ. Politeh. of Bucharest, Bucharest, Romania

fYear

2012

fDate

2-5 July 2012

Firstpage

1

Lastpage

3

Abstract

Scanning near-field microscopy can overcome diffraction limitation by exploiting the evanescent near fields existing close to any illuminated object. For investigations we used a scattering-type near-field optical microscope (s-SNOM). As the main problem of this kind of microscopy is connected with near field detection we focused on the metallic samples investigations based on the pseudoheterodyne detection. The influence of the oscillating mirror amplitude on the contrast image was studied. Lately the s-SNOM was successfully used for different investigations on the metallic nanoparticles.

Keywords

light diffraction; nanoparticles; near-field scanning optical microscopy; optical transfer function; contrast image; diffraction limitation; metallic nanoparticles; metallic samples; near field detection; pseudoheterodyne detection; s-SNOM; scattering near field optical microscope; Frequency modulation; Integrated optics; Microscopy; Optical imaging; Optical microscopy; Optical scattering; Optical surface waves; interference; near-field optical microscopy; pseudoheterodyne; scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Transparent Optical Networks (ICTON), 2012 14th International Conference on

Conference_Location

Coventry

ISSN

2161-2056

Print_ISBN

978-1-4673-2228-7

Electronic_ISBN

2161-2056

Type

conf

DOI

10.1109/ICTON.2012.6253948

Filename

6253948