DocumentCode
2791422
Title
Modeling and analysis of communication circuit performance using Markov chains and efficient graph representations
Author
Demir, A. ; Feldmann, P.
Author_Institution
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
fYear
2000
fDate
5-9 Nov. 2000
Firstpage
290
Lastpage
295
Abstract
In high-speed data networks, the bit-error-rate specification on the system can be very stringent, i.e., 10/sup -4/. At such error rates, it is not feasible to evaluate the performance of a design using straightforward, simulation based, approaches. Nevertheless performance prediction before actual hardware is built is essential for the design process. This work introduces a stochastic model and an analysis-based, nonMonte-Carlo method for performance evaluation of digital data communication circuits. The analyzed circuit is modeled by a number of interacting finite state machines with inputs described as functions on a Markov chain state-space. The composition of these elements results in a typically very large Markov chain. System performance measures, such as probability of bit errors and rate of synchronization loss, can be evaluated by solving linear problems involving the large Markov chain´s transition probability matrix. This paper first describes a dedicated multi-grid method used to solve these very large linear problems. The principal bottleneck in such an approach is the size of the Markov chain state-space, which grows exponentially with system complexity. The second part of this paper introduces a novel, graph based, data structure capable of efficiently storing and manipulating transition probability matrices for several million state Markov chains. The methods are illustrated on a real industrial clock-recovery circuit design.
Keywords
Markov processes; data communication equipment; finite state machines; performance evaluation; Markov chain; Markov chains; bit-error-rate specification; communication circuit performance; finite state machines; graph representations; high-speed data networks; performance prediction; stochastic model; Automata; Circuit analysis; Circuit optimization; Circuit simulation; Data communication; Error analysis; Hardware; Performance analysis; Process design; Stochastic processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-7803-6445-7
Type
conf
DOI
10.1109/ICCAD.2000.896488
Filename
896488
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