DocumentCode :
2791813
Title :
Automated statistical process control systems (ASPCS)
Author :
Palanki, H.R.
Author_Institution :
IBM Corp., San Jose, CA, USA
fYear :
1990
fDate :
1-3 Oct 1990
Firstpage :
204
Lastpage :
207
Abstract :
Describes eight steps necessary to automate statistical quality control for a manufacturing facility. Successful implementation depends mainly on management support and the talent involved. The benefits of this system include improved productivity and self-sufficiency for the operator. The objective can be achieved through the implementation of automated statistical process control systems (ASPCSs) starting from the development through the manufacturing phases of the product. The underlying objective of ASPCSs is to ensure overall process optimization through the real-time identification and removal of causes of defects at the earliest point of the process. This is accomplished by integrating all of the following functions: data automation, database management, problem detection through statistical methods, problem definition through diagnostic methods, and corrective action feedback and follow-up. The author provides the step-by-step procedures for implementing an ASPCS workstation and describes the demonstration of these functions in manufacturing applications
Keywords :
database management systems; quality control; statistical process control; automated statistical process control systems; corrective action feedback; data automation; database management; management; manufacturing facility; problem detection; process optimization; productivity; real-time identification; self-sufficiency; statistical quality control; workstation; Databases; Feedback; Manufacturing automation; Manufacturing processes; Process control; Production facilities; Productivity; Quality control; Statistical analysis; Workstations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Manufacturing Technology Symposium, 1990 Proceedings, Competitive Manufacturing for the Next Decade. IEMT Symposium, Ninth IEEE/CHMT International
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/IEMT9.1990.115007
Filename :
115007
Link To Document :
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