• DocumentCode
    2791813
  • Title

    Automated statistical process control systems (ASPCS)

  • Author

    Palanki, H.R.

  • Author_Institution
    IBM Corp., San Jose, CA, USA
  • fYear
    1990
  • fDate
    1-3 Oct 1990
  • Firstpage
    204
  • Lastpage
    207
  • Abstract
    Describes eight steps necessary to automate statistical quality control for a manufacturing facility. Successful implementation depends mainly on management support and the talent involved. The benefits of this system include improved productivity and self-sufficiency for the operator. The objective can be achieved through the implementation of automated statistical process control systems (ASPCSs) starting from the development through the manufacturing phases of the product. The underlying objective of ASPCSs is to ensure overall process optimization through the real-time identification and removal of causes of defects at the earliest point of the process. This is accomplished by integrating all of the following functions: data automation, database management, problem detection through statistical methods, problem definition through diagnostic methods, and corrective action feedback and follow-up. The author provides the step-by-step procedures for implementing an ASPCS workstation and describes the demonstration of these functions in manufacturing applications
  • Keywords
    database management systems; quality control; statistical process control; automated statistical process control systems; corrective action feedback; data automation; database management; management; manufacturing facility; problem detection; process optimization; productivity; real-time identification; self-sufficiency; statistical quality control; workstation; Databases; Feedback; Manufacturing automation; Manufacturing processes; Process control; Production facilities; Productivity; Quality control; Statistical analysis; Workstations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1990 Proceedings, Competitive Manufacturing for the Next Decade. IEMT Symposium, Ninth IEEE/CHMT International
  • Conference_Location
    Washington, DC
  • Type

    conf

  • DOI
    10.1109/IEMT9.1990.115007
  • Filename
    115007