DocumentCode
2791875
Title
Power Device Packaging Technologies for Extreme Environments
Author
Johnson, R. Wayne ; Williams, John
Author_Institution
Auburn Univ., AL
fYear
2005
fDate
5-12 March 2005
Firstpage
1
Lastpage
6
Abstract
Silicon carbide is a wide bandgap semiconductor capable of operation at temperatures in excess of 600degC. However, high temperature contacts and packaging to interface with the other elements of the electrical system are required. Contact pad stacks, die attach, wire bonding and passivation materials and techniques have been demonstrated for use at temperatures from 300-350degC. The contacts stacks use amorphous TaSi2:N2 as a diffusion barrier to prevent oxidation of the Ni or Al:Ti based contacts. Liquid transient phase bonding has been developed with Au-Sn:Au, yielding high die shear strength after 2000 hours at 350degC. The die attach system has also shown no degradation after 500 hours at 400degC. Large diameter gold wire bonding was used for top side electrical contact. Polyimide has been demonstrated for use as a passivation layer at 300degC. Alternate passivation materials must still be developed for higher temperature, higher voltage applications
Keywords
Schottky barriers; high-temperature electronics; lead bonding; ohmic contacts; passivation; power semiconductor devices; semiconductor device packaging; silicon compounds; tantalum compounds; wide band gap semiconductors; 2000 hrs; 300 C; 300 to 350 C; 350 C; 400 C; 500 hrs; 600 C; Al:Ti; Au-Sn:Au; Ni; TaSi2:N2; amorphous; contact pad stacks; die attach system; diffusion barrier; electrical contact; gold wire bonding; high temperature contacts; liquid transient phase bonding; oxidation; passivation materials; power device packaging technologies; silicon carbide; wide bandgap semiconductor; Bonding; Contacts; Microassembly; Passivation; Semiconductor device packaging; Semiconductor materials; Silicon carbide; Temperature; Wide band gap semiconductors; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace Conference, 2005 IEEE
Conference_Location
Big Sky, MT
Print_ISBN
0-7803-8870-4
Type
conf
DOI
10.1109/AERO.2005.1559569
Filename
1559569
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