• DocumentCode
    2791974
  • Title

    Frequency domain analysis of switching noise on power supply network

  • Author

    Zhao, S. ; Roy, K. ; Cheng-Kok Koh

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2000
  • fDate
    5-9 Nov. 2000
  • Firstpage
    487
  • Lastpage
    492
  • Abstract
    In this paper, we propose an approach for the analysis of power supply noise in the frequency domain for power/ground (P/G) networks of tree topologies. We model the P/G network as a linear time invariant (LTI) pseudo-distributed RLC network and the gates (or cells) as time-varying current sources. Voltage fluctuation caused by the switching events is calculated based on the effective impedances seen by the corresponding current sources and the spatial correlation between the nodes of the power network. Superposition is applied to the LTI system to obtain the overall noise spectrum at any node of the power supply network. Inverse Fast Fourier Transformation (IFFT) is then performed on the frequency domain noise spectrum to obtain the time domain noise waveform. The proposed algorithm has a complexity of O(n/sup 2/). Experimental results show that our approach can produce accurate noise waveforms.
  • Keywords
    constant current sources; fast Fourier transforms; frequency-domain analysis; time-varying networks; complexity; frequency domain analysis; frequency domain noise spectrum; inverse fast Fourier transformation; linear time invariant pseudo-distributed RLC network; noise waveforms; overall noise spectrum; power supply network; power supply noise; power/ground networks; spatial correlation; switching events; switching noise; time domain noise waveform; time-varying current sources; tree topologies; voltage fluctuation; Circuit noise; Computer networks; Frequency domain analysis; Phase noise; Power supplies; Power systems; RLC circuits; Switching circuits; Very large scale integration; Voltage fluctuations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-6445-7
  • Type

    conf

  • DOI
    10.1109/ICCAD.2000.896520
  • Filename
    896520