DocumentCode
2791974
Title
Frequency domain analysis of switching noise on power supply network
Author
Zhao, S. ; Roy, K. ; Cheng-Kok Koh
Author_Institution
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
fYear
2000
fDate
5-9 Nov. 2000
Firstpage
487
Lastpage
492
Abstract
In this paper, we propose an approach for the analysis of power supply noise in the frequency domain for power/ground (P/G) networks of tree topologies. We model the P/G network as a linear time invariant (LTI) pseudo-distributed RLC network and the gates (or cells) as time-varying current sources. Voltage fluctuation caused by the switching events is calculated based on the effective impedances seen by the corresponding current sources and the spatial correlation between the nodes of the power network. Superposition is applied to the LTI system to obtain the overall noise spectrum at any node of the power supply network. Inverse Fast Fourier Transformation (IFFT) is then performed on the frequency domain noise spectrum to obtain the time domain noise waveform. The proposed algorithm has a complexity of O(n/sup 2/). Experimental results show that our approach can produce accurate noise waveforms.
Keywords
constant current sources; fast Fourier transforms; frequency-domain analysis; time-varying networks; complexity; frequency domain analysis; frequency domain noise spectrum; inverse fast Fourier transformation; linear time invariant pseudo-distributed RLC network; noise waveforms; overall noise spectrum; power supply network; power supply noise; power/ground networks; spatial correlation; switching events; switching noise; time domain noise waveform; time-varying current sources; tree topologies; voltage fluctuation; Circuit noise; Computer networks; Frequency domain analysis; Phase noise; Power supplies; Power systems; RLC circuits; Switching circuits; Very large scale integration; Voltage fluctuations;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2000. ICCAD-2000. IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-7803-6445-7
Type
conf
DOI
10.1109/ICCAD.2000.896520
Filename
896520
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