Title :
Breakdown of a thin dielectric liquid layer and interfacial phenomena
Author :
Brosseau, Christian
Author_Institution :
Lab. de Spectrometrie Phys., Univ. Joseph Fourier, St. Martin d´´Heres, France
Abstract :
The author describes measurements of electrical breakdown on thin liquid dielectric (capacitor impregnant) layers for different interfacial situations. The dielectric strength depends on various factors such as electrode area, gap spacing, the nature of the interface in contact with the liquid, and temperature. The breakdown phenomena are shown to be either connected to high-field conduction-boiling or electrohydrodynamic cavitations leading to the generation of a vapor bubble in the prebreakdown regime-or related to the presence of particles and/or local field enhancements
Keywords :
cavitation; dielectric properties of liquids and solutions; electric breakdown of liquids; electric strength; electrohydrodynamics; interface phenomena; all-film capacitors; boiling; capacitor impregnant layers; dielectric strength; electrical breakdown; electrode area; electrohydrodynamic cavitations; gap spacing; high-field conduction; interfacial phenomena; local field enhancements; prebreakdown regime; presence of particles; thin dielectric liquid layer; vapor bubble; Capacitors; Contacts; Dielectric breakdown; Dielectric liquids; Dielectric measurements; Electric breakdown; Electric variables measurement; Electrodes; Electrohydrodynamics; Temperature dependence;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-87942-568-7
DOI :
10.1109/ICPADM.1991.172046