DocumentCode
2792552
Title
Optimization of EPDM compounds for resistant insulators to electrical tracking
Author
da Costa, R.A. ; Hattori, R.S. ; Redondo, E.G. ; Bruns, R.E. ; Scarminio, I.S.
Author_Institution
Pirelli, Santo Andre, Brazil
fYear
1991
fDate
8-12 Jul 1991
Firstpage
300
Abstract
The efficiencies of two transition metal oxides (Fe2O 3 and Co3O4), one hydrated filler (Al 2O33H2O), and their mixtures as anti-tracking components in an EPDM (ethylene-propylene-diene monomer) compound have been investigated. Their concentration ranges varied between preestablished limits, 100-230 phr for Al2O3 3H2O and 0-23 phr for iron and cobalt oxides. The electrical tracking test was based on the modified IEC 587 method. Significant F test values at the 95% confidence level for weight loss and applied voltage vs. failure time integral values were obtained for the fit of quadratic and special cubic functions, respectively. An overlay of surface contour plots shows that the region of maximum tracking resistance coincides with that of minimum weight loss, thus easing the selection of optimal composition range. Due to the significant binary interactions between trihydrated alumina/iron oxide and cobalt oxide, the 159-210 phr Al2O33H2 O, 3.5-11.5 phr Fe2O3, and 0-2.3 phr Co3O4 concentrations result in EPDM compounds with elevated electrical resistance and small polymer erosion
Keywords
composite insulating materials; filled polymers; insulation testing; organic insulating materials; surface discharges; Fe2O3-Co3O4-Al2O3H2O additive; anti-tracking components; electrical tracking; ethylene-propylene-diene monomer; failure time integral; minimum weight loss; modified IEC 587 method; optimal composition range; resistant insulators; surface contour plots; Cobalt; Electric resistance; IEC standards; Insulation life; Iron; Polymers; Surface fitting; Surface resistance; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location
Tokyo
Print_ISBN
0-87942-568-7
Type
conf
DOI
10.1109/ICPADM.1991.172056
Filename
172056
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