Title : 
Detection of reflector surface error from near-field data: Effect of edge diffracted field
         
        
            Author : 
Cherrette, A.R. ; Lee, S.W. ; Acosta, R.
         
        
            Author_Institution : 
Univ. of Illinois at Urbana - Champaign, Urbana, Illinois
         
        
        
        
        
        
        
            Keywords : 
Antenna measurements; Apertures; Electromagnetic diffraction; Electromagnetic fields; Equations; Laboratories; Length measurement; NASA; Phase measurement; Reflector antennas;
         
        
        
        
            Conference_Titel : 
Antennas and Propagation Society International Symposium, 1987
         
        
            Conference_Location : 
Blacksburg, VA, USA
         
        
        
            DOI : 
10.1109/APS.1987.1150116