Title :
New view on optical quality of Cr4+:Mg2SiO4 laser crystals: analysis of absorption spectra
Author :
Lebedev, V.F. ; Tenyakov, S.Yu. ; Gaister, A.V. ; Bystrova, A.A.
Author_Institution :
Prokhorov Gen. Phys. Inst., Russian Acad. of Sci., Moscow, Russia
Abstract :
Nowadays chromium-doped forsterite single crystals (Cr4+:Mg2SiO4) are one of the key elements of high power femtosecond lasers. Optical quality of crystal is commonly determined by the parameter FOM = alphap/alphapar, where alphap is absorption of the crystal at the pump wavelength and alphapar is parasitic losses at the laser emission wavelength. In the present work we analyzed the spectra of more than twenty crystals with various chrome concentration. All the crystals were grown by the Czochralski technique in the atmosphere with various content of oxygen in laboratories of Kharkov and Moscow. The parasitic absorption under consideration was observed in the majority of the examined crystals and probably belongs to the chromium absorption bands with charge transfer. The appearance of parasitic absorption correlates with the appearance of absorption in the visible part of spectrum. Evidently this explains good correlation between output power of the CW Cr4+:Mg2SiO4 laser and the FOM, calculated with the usage of absorption in the visible part of crystal spectrum.
Keywords :
charge exchange; chromium; crystal growth from melt; infrared spectra; magnesium compounds; optical materials; solid lasers; Czochralski technique; Mg2SiO4:Cr4+; absorption spectra; charge transfer; chromium absorption band; chromium-doped forsterite single crystal; high power femtosecond laser; laser crystal; optical quality; parasitic absorption; Atmosphere; Chromium; Crystals; Electromagnetic wave absorption; Laboratories; Laser excitation; Optical pumping; Power lasers; Pump lasers; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics 2009 and the European Quantum Electronics Conference. CLEO Europe - EQEC 2009. European Conference on
Conference_Location :
Munich
Print_ISBN :
978-1-4244-4079-5
Electronic_ISBN :
978-1-4244-4080-1
DOI :
10.1109/CLEOE-EQEC.2009.5192441