DocumentCode
2793424
Title
Thickness measuring of multilayer conductor based on eddy current testing
Author
Guohou, Li ; Xusheng, Kang ; Pingjie, Huang ; Peihua, Chen ; Dibo, Hou ; Guangxin, Zhang ; Zekui, Zhou
Author_Institution
Nat. Key Lab. of Ind. Control Technol., Zhejiang Univ., Hangzhou, China
fYear
2009
fDate
17-19 June 2009
Firstpage
3269
Lastpage
3272
Abstract
Eddy current testing (ECT) is becoming a widely used inspection technique, particularly in the aircraft, power and nuclear industries. Many factors may affect the eddy current response. Inverse problems to determine the thickness from ECT signals of multilayer conductors have been a challenge for a certain degree. The objectives of this study are to introduce a method based on improved Back Propagation neural network (BPNN) to identify the multilayer thickness from their ECT signals. The simulation study and an experimental validation carried out on a number of specimens with different known thickness confirmed the suitability of the proposed approach for multilayer thickness measuring.
Keywords
backpropagation; eddy currents; inspection; inverse problems; back propagation neural network; eddy current testing; inspection technique; inverse problems; multilayer conductor; multilayer thickness measuring; Aerospace industry; Aircraft; Conductors; Current measurement; Eddy current testing; Electrical capacitance tomography; Inspection; Multi-layer neural network; Nonhomogeneous media; Thickness measurement; Eddy-current Testing; Improved BP Neural Network; Inverse Problems; Multilayer Conductor; Thickness Measuring;
fLanguage
English
Publisher
ieee
Conference_Titel
Control and Decision Conference, 2009. CCDC '09. Chinese
Conference_Location
Guilin
Print_ISBN
978-1-4244-2722-2
Electronic_ISBN
978-1-4244-2723-9
Type
conf
DOI
10.1109/CCDC.2009.5192475
Filename
5192475
Link To Document