• DocumentCode
    2793424
  • Title

    Thickness measuring of multilayer conductor based on eddy current testing

  • Author

    Guohou, Li ; Xusheng, Kang ; Pingjie, Huang ; Peihua, Chen ; Dibo, Hou ; Guangxin, Zhang ; Zekui, Zhou

  • Author_Institution
    Nat. Key Lab. of Ind. Control Technol., Zhejiang Univ., Hangzhou, China
  • fYear
    2009
  • fDate
    17-19 June 2009
  • Firstpage
    3269
  • Lastpage
    3272
  • Abstract
    Eddy current testing (ECT) is becoming a widely used inspection technique, particularly in the aircraft, power and nuclear industries. Many factors may affect the eddy current response. Inverse problems to determine the thickness from ECT signals of multilayer conductors have been a challenge for a certain degree. The objectives of this study are to introduce a method based on improved Back Propagation neural network (BPNN) to identify the multilayer thickness from their ECT signals. The simulation study and an experimental validation carried out on a number of specimens with different known thickness confirmed the suitability of the proposed approach for multilayer thickness measuring.
  • Keywords
    backpropagation; eddy currents; inspection; inverse problems; back propagation neural network; eddy current testing; inspection technique; inverse problems; multilayer conductor; multilayer thickness measuring; Aerospace industry; Aircraft; Conductors; Current measurement; Eddy current testing; Electrical capacitance tomography; Inspection; Multi-layer neural network; Nonhomogeneous media; Thickness measurement; Eddy-current Testing; Improved BP Neural Network; Inverse Problems; Multilayer Conductor; Thickness Measuring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Decision Conference, 2009. CCDC '09. Chinese
  • Conference_Location
    Guilin
  • Print_ISBN
    978-1-4244-2722-2
  • Electronic_ISBN
    978-1-4244-2723-9
  • Type

    conf

  • DOI
    10.1109/CCDC.2009.5192475
  • Filename
    5192475