Title :
Thickness measuring of multilayer conductor based on eddy current testing
Author :
Guohou, Li ; Xusheng, Kang ; Pingjie, Huang ; Peihua, Chen ; Dibo, Hou ; Guangxin, Zhang ; Zekui, Zhou
Author_Institution :
Nat. Key Lab. of Ind. Control Technol., Zhejiang Univ., Hangzhou, China
Abstract :
Eddy current testing (ECT) is becoming a widely used inspection technique, particularly in the aircraft, power and nuclear industries. Many factors may affect the eddy current response. Inverse problems to determine the thickness from ECT signals of multilayer conductors have been a challenge for a certain degree. The objectives of this study are to introduce a method based on improved Back Propagation neural network (BPNN) to identify the multilayer thickness from their ECT signals. The simulation study and an experimental validation carried out on a number of specimens with different known thickness confirmed the suitability of the proposed approach for multilayer thickness measuring.
Keywords :
backpropagation; eddy currents; inspection; inverse problems; back propagation neural network; eddy current testing; inspection technique; inverse problems; multilayer conductor; multilayer thickness measuring; Aerospace industry; Aircraft; Conductors; Current measurement; Eddy current testing; Electrical capacitance tomography; Inspection; Multi-layer neural network; Nonhomogeneous media; Thickness measurement; Eddy-current Testing; Improved BP Neural Network; Inverse Problems; Multilayer Conductor; Thickness Measuring;
Conference_Titel :
Control and Decision Conference, 2009. CCDC '09. Chinese
Conference_Location :
Guilin
Print_ISBN :
978-1-4244-2722-2
Electronic_ISBN :
978-1-4244-2723-9
DOI :
10.1109/CCDC.2009.5192475