DocumentCode
2793519
Title
An analysis of capacitor failure mechanism during production/utilization and its remedies
Author
Paul, J.C.
Author_Institution
Dept. of Electr. Eng., Tripura Eng. Coll., India
fYear
1991
fDate
8-12 Jul 1991
Firstpage
474
Abstract
The author reports the failure mechanism of a capacitor element and power capacitor during production tests. A defective capacitor which has been in use for years was also analyzed. Some remedial measures are suggested. It is indicated that partial discharge and aging are the ultimate causes of failure (other than mechanical failure) of the capacitor while in use
Keywords
ageing; capacitors; electron device testing; failure analysis; partial discharges; power capacitors; production testing; aging; capacitor failure mechanism; defective capacitor; lead position; partial discharge; power capacitor; production tests; remedial measures; stress distribution; voltage distribution; Dielectric losses; Failure analysis; High-K gate dielectrics; Lead; Power capacitors; Power system transients; Production; Raw materials; Stress; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location
Tokyo
Print_ISBN
0-87942-568-7
Type
conf
DOI
10.1109/ICPADM.1991.172100
Filename
172100
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