Title :
An analysis of capacitor failure mechanism during production/utilization and its remedies
Author_Institution :
Dept. of Electr. Eng., Tripura Eng. Coll., India
Abstract :
The author reports the failure mechanism of a capacitor element and power capacitor during production tests. A defective capacitor which has been in use for years was also analyzed. Some remedial measures are suggested. It is indicated that partial discharge and aging are the ultimate causes of failure (other than mechanical failure) of the capacitor while in use
Keywords :
ageing; capacitors; electron device testing; failure analysis; partial discharges; power capacitors; production testing; aging; capacitor failure mechanism; defective capacitor; lead position; partial discharge; power capacitor; production tests; remedial measures; stress distribution; voltage distribution; Dielectric losses; Failure analysis; High-K gate dielectrics; Lead; Power capacitors; Power system transients; Production; Raw materials; Stress; Voltage;
Conference_Titel :
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-87942-568-7
DOI :
10.1109/ICPADM.1991.172100
