Dielectric breakdown of ceramics and glass ceramics

Author

Owate, I.O. ; Freer, R.

Author_Institution

Manchester Univ., UK

fYear

1992

fDate

7-10 Sep 1992

Firstpage

443

Lastpage

446

Abstract

Discusses the AC dielectric breakdown of alumina, aluminium nitride and cordierite glass ceramics (MgO-Al₂O₃-SiO₂) at room temperature. The importance of specimen shape, thickness, surface finish and test conditions are assessed. For dielectric breakdown tests specimens were prepared in the form of 26 mm discs of various thicknesses (in the range 0.2-10.0 mm). In the case of alumina ceramics, plano-concave specimens were also prepared by diamond grinding one face to provide a curved surface (concave region 22 mm diameter, thickness at the centre 0.5-6.0 mm). The surface finish of the specimens ranged from as-received to 0.25 μm diamond polished

Keywords

aluminium compounds; ceramics; electric breakdown of solids; electric strength; glass; magnesium compounds; materials testing; silicon compounds; 0.2 to 10 mm; 50 Hz; AC dielectric breakdown; Al₂O₃; AlN; MgO-Al₂O₃-SiO₂; concave region; cordierite glass ceramics; curved surface; diamond grinding; diamond polished; plano-concave specimens; room temperature; specimen shape; surface finish; test conditions; thicknesses;

fLanguage

English

Publisher

iet

Conference_Titel

Dielectric Materials, Measurements and Applications, 1992., Sixth International Conference on

Conference_Location

Manchester

Print_ISBN

0-85296-551-6

Type

conf

Filename

186978