DocumentCode
2793575
Title
A Complexity Reliability Model
Author
Schneidewind, Norm ; Hinchey, Mike
Author_Institution
Naval Postgrad. Sch., Monterey, CA, USA
fYear
2009
fDate
16-19 Nov. 2009
Firstpage
1
Lastpage
10
Abstract
A model of software complexity and reliability is developed. It uses an evolutionary process to transition from one software system to the next, while complexity metrics are used to predict the reliability for each system. Our approach is experimental, using data pertinent to the NASA satellite systems application environment. We do not use sophisticated mathematical models that may have little relevance for the application environment. Rather, we tailor our approach to the software characteristics of the software to yield important defect-related predictors of quality. Systems are tested until the software passes defect presence criteria and is released. Testing criteria are based on defect count, defect density, and testing efficiency predictions exceeding specified thresholds. In addition, another type of testing efficiency - a directed graph representing the complexity of the software and defects embedded in the code - is used to evaluate the efficiency of defect detection in NASA satellite system software. Complexity metrics were found to be good predictors of defects and testing efficiency in this evolutionary process.
Keywords
directed graphs; software metrics; software quality; software reliability; complexity metrics; complexity reliability model; defect detection; defect-related quality predictors; directed graph; evolutionary process; mathematical models; software complexity; software reliability; Application software; Embedded software; Mathematical model; NASA; Satellites; Software quality; Software systems; Software testing; System software; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Reliability Engineering, 2009. ISSRE '09. 20th International Symposium on
Conference_Location
Mysuru, Karnataka
ISSN
1071-9458
Print_ISBN
978-1-4244-5375-7
Electronic_ISBN
1071-9458
Type
conf
DOI
10.1109/ISSRE.2009.10
Filename
5361943
Link To Document