DocumentCode
2793675
Title
Deterioration of metal oxide surge arrester element caused by internal partial discharges under polluted conditions
Author
Izumi, K. ; Honma, H. ; Tanaka, J.
Author_Institution
Central Res. Inst. of Electr. Power Ind., Yokosuka, Japan
fYear
1991
fDate
8-12 Jul 1991
Firstpage
517
Abstract
In order to clarify the influence of internal partial discharges on metal oxide surge arrester elements (ZnO varistors) caused under polluted conditions, tests simulating internal partial discharges were made. In the simulation tests, internal partial discharges occurred between the ZnO varistor side surface and the needle in both air and nitrogen atmospheres. It was found that the deterioration of the ZnO varistor occurs in an air atmosphere. Some aspects in the deterioration of ZnO varistors were elucidated from measurements of the V-I characteristics, analysis of the gas generated, observations by scanning electron microscope, and thermally stimulated current spectra. It is shown that the deterioration of a ZnO varistor under partial discharge conditions in air may be caused by both the erosion of the side surface of the ZnO varistor and the action of some generated gases. This deterioration may be accelerated under service conditions
Keywords
environmental degradation; partial discharges; scanning electron microscope examination of materials; semiconductor materials; surge protection; varistors; zinc compounds; N2 atmosphere; V-I characteristics; ZnO varistors; air atmosphere; arrester deterioration; generated gases; internal partial discharges; metal oxide surge arrester element; polluted conditions; scanning electron microscope; side surface erosion; simulation tests; thermally stimulated current spectra; Arresters; Atmosphere; Atmospheric modeling; Partial discharges; Pollution; Surface discharges; Surges; Testing; Varistors; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Properties and Applications of Dielectric Materials, 1991., Proceedings of the 3rd International Conference on
Conference_Location
Tokyo
Print_ISBN
0-87942-568-7
Type
conf
DOI
10.1109/ICPADM.1991.172111
Filename
172111
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