• DocumentCode
    2793844
  • Title

    Algorithm development to ascertain the true characteristic impedance of a wire for wire diagnostics

  • Author

    Bechhoefer, Eric ; Yu, Jun

  • Author_Institution
    Goodrich Fuels & Utility Syst., Vergennes, VT
  • fYear
    2005
  • fDate
    5-12 March 2005
  • Firstpage
    3797
  • Lastpage
    3802
  • Abstract
    Electronic wiring interconnect system (EWIS) traditionally have been treated as a commodity as apposed to a system. The EWIS, being responsible for the transfer of power and information of aircraft systems, represents a point of failure that is usually considered as a maintainer´s last resort. We attempt to develop a diagnostic capability for the detection and progression of EWIS damage of data using time domain reflectometry (TDR). TDR measures changes in EWIS characteristic impedance. Damage, such as chafe, nicks and corrosion, change the characteristic impedance of the EWIS, suggesting that detection is dependent upon as true representation of impedance as possible. Wire characteristic impedance is corrupted by: multiple reflections (an artifact resulting from the interaction of the TDR waveform and changes in impedance on the EWIS), and attenuation in the high frequency component of the TDR signal. A transmission line problem was developed using RLC circuit model. We present systems of differential equations to solve for the wire characteristic impedance. This led to a system of wave equations in terms of line voltage and current, which we solve by the method of characteristics. The inverse scattering method was then successfully implemented to remove multiple reflections. We then control environmental effects including skin effect, capacitance and wire resistance to account for attenuation in the TDR signal. Formulas based on hypothesis as well as derived from the electromagnetic field theory for the capacitance as a function of the distance of the wires were developed and tested. These solutions were then implemented in a hand held device for the prognostics of EWIS
  • Keywords
    RLC circuits; differential equations; electric impedance; electromagnetic field theory; electromagnetic wave scattering; time-domain reflectometry; transmission line theory; wave equations; wires (electric); EWIS damage; RLC circuit model; diagnostic capability; differential equations; electromagnetic field theory; electronic wiring interconnect system; hand held device; inverse scattering; method of characteristics; skin effect; time domain reflectometry; transmission line problem; wave equations; wire capacitance; wire characteristic impedance; wire diagnostics; wire resistance; Aerospace electronics; Aircraft; Attenuation; Capacitance; Impedance; Integrated circuit interconnections; Power system interconnection; Reflectometry; Wire; Wiring;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2005 IEEE
  • Conference_Location
    Big Sky, MT
  • Print_ISBN
    0-7803-8870-4
  • Type

    conf

  • DOI
    10.1109/AERO.2005.1559686
  • Filename
    1559686