Title :
Electro-thermal instability in low voltage power MOS: Experimental characterization
Author :
Breglio, G. ; Frisina, F. ; Magrì, A. ; Spirito, P.
Author_Institution :
Dipt. di Ingegneria Elettronica e della Telecomunicazioni, Naples Univ., Italy
Abstract :
In this paper, we present experimental results of dynamic thermal mapping on a new class of low voltage high current power MOSFETs. The reported results underline that, as in the case of power BJTs, the hot-spot phenomenon also occurs in this class of devices. Moreover, we give a theoretical interpretation of this phenomenon and propose a novel approach to understand the causes that can determine the temperature instabilities in such MOS devices
Keywords :
electric current; power MOSFET; semiconductor device measurement; temperature distribution; thermal analysis; thermal stability; MOS devices; dynamic thermal mapping; electro-thermal instability; hot-spot phenomenon; low voltage high current power MOSFETs; low voltage power MOS; power BJTs; temperature instability; Low voltage; MOS devices; Microscopy; Optical surface waves; Oscilloscopes; Radiometry; Semiconductor optical amplifiers; Spatial resolution; Temperature distribution; Temperature sensors;
Conference_Titel :
Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5290-4
DOI :
10.1109/ISPSD.1999.764106
