DocumentCode :
2793950
Title :
High performance extended drain MOSFETs (EDMOSFETs) with metal field plate
Author :
Lee, Mueng-Ryul ; Kwon, Oh-Kyong
Author_Institution :
Div. of Electron. & Electr. Eng., Hanyang Univ., Seoul, South Korea
fYear :
1999
fDate :
1999
Firstpage :
249
Lastpage :
252
Abstract :
We propose a structure for extended drain MOSFETs (EDMOSFETs) with a metal field plate separated from the gate electrode instead of the polysilicon field plate in conventional LDMOSFETs. The specific on-resistance is improved by applying a higher voltage to the field plate than the gate voltage because of the enhanced conductivity modulation, and the breakdown voltage of 280 V is not changed by the field plate voltage. When a voltage of 50 V is applied to the field plate, the specific on-resistance of a 280 V EDMOSFET is 17.63 mΩcm2, which is lower than that of conventional LDMOSFETs by 11.8%. The performance of the EDMOSFETs is the best reported result in 280 V class lateral high voltage MOS devices
Keywords :
electric resistance; electrical conductivity; electrodes; power MOSFET; power integrated circuits; semiconductor device breakdown; 280 V; 50 V; EDMOSFETs; HVIC; LDMOSFETs; breakdown voltage; conductivity modulation; extended drain MOSFET structure; extended drain MOSFETs; field plate voltage; gate electrode; lateral high voltage MOS devices; metal field plate; polysilicon field plate; specific on-resistance; Breakdown voltage; Charge carrier density; Conductivity; Electric breakdown; Electrodes; Fabrication; Immune system; MOSFETs; Medical simulation; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on
Conference_Location :
Toronto, Ont.
ISSN :
1063-6854
Print_ISBN :
0-7803-5290-4
Type :
conf
DOI :
10.1109/ISPSD.1999.764110
Filename :
764110
Link To Document :
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