Title :
The behavior of digital circuits under substrate noise in a mixed-signal smart-power environment
Author :
Secareanu, Radu M. ; Kourtev, Ivan S. ; Becerra, Juan ; Watrobski, Thomas E. ; Morton, Christopher ; Staub, William ; Tellier, Thomas ; Friedman, Eby G.
Author_Institution :
Dept. of Electr. Eng., Rochester Univ., NY, USA
Abstract :
The behavior of digital circuits in a noisy environment in mixed-signal smart-power systems is described in this paper. Several models and mechanisms explaining the process in which substrate noise affects on-chip digital circuits as well as the noise immunity behavior of digital circuits are presented and discussed. The models and mechanisms are demonstrated by simulations and by extensive test chip-based experimental data
Keywords :
circuit simulation; digital integrated circuits; integrated circuit modelling; integrated circuit noise; integrated circuit testing; mixed analogue-digital integrated circuits; power integrated circuits; digital circuit behaviour; digital circuits; mixed-signal smart-power environment; mixed-signal smart-power systems; models; noise immunity behaviour; on-chip digital circuits; process mechanisms; simulations; substrate noise; test chip; Circuit noise; Digital circuits; Driver circuits; Logic; Noise generators; Power generation; Semiconductor device noise; Substrates; Voltage; Working environment noise;
Conference_Titel :
Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5290-4
DOI :
10.1109/ISPSD.1999.764111
